X-Ray Analyser With Silicon-Semiconductor Detector

Supplier : Citizen Scale ( India ) Pvt. Ltd.

Key Features of X-Ray Analyser With Silicon-Semiconductor Detector
  • Silicon-semiconductor detector with electrical cooling.
  • Various options to form the X-ray beam.
  • Vacuum sample chamber for enhanced element range from Aluminium.
  • Excellent price/performance ratio.
  • Provided with spectrometer with digital pulse processing.
  • Available beam diameter down to 25 µm.
  • User-friendly operation due to XMaster software.
  • Versatile for production, incoming inspection and laboratory environments.
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Product Profile of X-Ray Analyser With Silicon-Semiconductor Detector
X-Ray Analyser with Silicon-Semiconductor Detector ensures various options to form the X-ray beam and provided with vacuum sample chamber for enhanced element range from aluminium. The X-Ray Analyser is available under the brand name NanoMaster µ is provided with spectrometer with digital pulse processing. The X-Ray Analyser is available in beam diameter down to 25 µm. X-Ray Analyser with Silicon-Semiconductor Detector is ideal for incoming inspection and laboratory environments.

Citizen Scale [I] Pvt. Ltd is engaged in manufacturing X-Ray Analyser with Silicon-Semiconductor Detector. Citizen Scale [I] Pvt. Ltd supplies diverse types of balances, scales, weigh bridge and system, jewellery instruments, professional digital ultrasonic cleaner, check weigher and detectors, mass comprator, standard calibration weights etc. Citizen Scale [I] Pvt. Ltd is an ISO 9001:2008 recognised company.

Key Features of X-Ray Analyser With Silicon-Semiconductor Detector
  • Silicon-semiconductor detector with electrical cooling.
  • Various options to form the X-ray beam.
  • Vacuum sample chamber for enhanced element range from Aluminium.
  • Excellent price/performance ratio.
  • Provided with spectrometer with digital pulse processing.
  • Available beam diameter down to 25 µm.
  • User-friendly operation due to XMaster software.
  • Versatile for production, incoming inspection and laboratory environments.